EMS sponsored events
EMS has designed several ways in which the society supports the organisation of microscopy related events within Europe. Next to the well-defined involvement in the organisation of the quadrennial European Microscopy Congresses (EMC series, successor of EUREM) and the explicit support of the EMS extensions EMS also supports local microscopy related meetings, schools, courses etc.. At present this support includes financial sponsoring to cover part of the costs of two invited lecturers, assistance in electronic distribution of information about the meeting to the extended EMS membership, etc...
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Past Top
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School on structure determination by the combination of X-ray powder diffraction and Electron Crystallography
01 to 04 August 2006
Antwerp – BelgiumOrganization: University of Antwerp, EMAT
EMS sponsored lectures in Antwerp
- L. Marks (Northwestern University, USA)
- L. Meshi (Ben-Gurion University, Beer-Sheva, Israel)
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Microscience 2006
27 to 29 June 2006
London – United KingdomOrganization: RMS
EMS sponsored lectures in London
- S. McDanels (NASA, USA)
- T. Schaeffer (Center for Nanotechnology & Physikalisches Institut, Universität Münster, Germany)
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12th WIEN2k workshop & 2nd CHIRALTEM workshop
19 to 23 April 2006
Vienna – AustriaOrganization: Vienna University of Technology, CHIRALTEM project
EMS sponsored lectures in Vienna
- G. Botton (McMaster University, Canada)
- L. Reining (Ecole Polytechnique, France)
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Quantitative Electron Microscopy 2005
25 September to 07 October 2005
Saint-Aygulf – FranceOrganization: Center for Material Elaboration & Structural Studies (CEMES), CNRS
ReportEMS sponsored lectures in St. Aygulf
- H. Lichte (Dresden University of Technology, Germany):
- "High resolution electron holography"
- H. Lichte (Dresden University of Technology, Germany):
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EMAG-NANO 2005
31 August 2005 to 02 September 2008
Leeds – United KingdomOrganization: EMAG, Institute of Physics
ReportEMS sponsored lectures in Leeds
- F. Besenbacher (Aarhus University, Denmark):
- "Dynamics of nanostructures on surfaces revealed by high resolution, fast scanning STM"
- F. Besenbacher (Aarhus University, Denmark):