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• Pier Giorgio Merli TEM School in Materials Science - 8th edition

  03 to 14 October 2022
  Bologna – Italy

  The 8th edition of the School, organized by CNR-IMM and SISM will take place in Bologna (Italy) from 3 to 14 October 2022.
  As in previous editions, in two full weeks, following a well-tested series of theoretical and practical lessons, the School will provide students and researchers engaged in the materials science field (physics, chemistry, engineering) with a qualified introduction to Transmission and Scanning Transmission Electron Microscopy techniques. For a complete description and an updated calendar of the course, please refer to the School website temschool.bo.imm.cnr.it.

  Registration is open at the SISM web site www.sism.it/Details/178.

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• Spence Memorial Symposium

  11 to 13 October 2022
  Arizona State University – Tempe – USA

  John Spence had a remarkable scientific impact over an illustrious career spanning nearly 50 years before passing away in June, 2021. His friends and colleagues are honoring his legacy with an international symposium based around the topics of imaging, diffraction and crystallography. A key objective is to project his achievements into the future by discussing current state-of-the art as well as exploring future directions and opportunities in related fields. Contributed talks and posters are welcome. We are especially interested in providing a forum for the  next generation of researchers in these areas.

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• Advanced TEM Specimen Preparation - Stuttgart Center for Electron Microscopy (StEM)

  24 to 28 October 2022
  StEM – Stuttgart – Germany

  Workshop

  The workshop on Advanced TEM Specimen Preparation will present a selection of advanced techniques for the preparation of TEM samples. It includes lectures, equipment demonstrations, as well as practical hands-on laboratory, work for the participants under the guidance of staff members of the Stuttgart Center for Electron Microscopy, demonstrating the following methods:

  • Ultramicrotomy (UM)
  • Focused Ion Beam (FIB)
  • Ion Milling (IM)
  • Automated Tripod Polishing (Tripod)
  • Metallographic Pre-preparation (MP)

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• XVI Interamerican Congress on Microscopy (CIASEM 2022)

  26 to 28 October 2022
  Oaxaca – Mexico

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• Microscopy Winter School 2023: Practical Course in Advanced Microscopy

  23 to 27 January 2023
  Zurich – Switzerland

  
  
  

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• Microscopy Conference 2023 (MC2023)

  26 February to 02 March 2023
  Darmstadt – Germany

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• The 9th Annual World Congress of Advanced Materials-2023

  10 to 12 May 2023
  Tokyo – Japan

  BIT's 9th Annual World Congress of Advanced Materials-2023 (WCAM-2023 (Japan)) will be held at Japan during May 10-12, 2023. On behalf of the Organizing Committee of WCAM-2023 (Japan), we cordially invite you to participate in this initiative congress. The fruitful conference program includes plenary lectures, breakout sessions, panel discussion, poster showcase on a variety of topics and various programs for participants from different countries around the world.
  

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• ISM2023 - The 56th Annual Meeting of the Israel Society for Microscopy

  22 and 23 May 2023
  Binyanei Hauma - International Convention Center – Jerusalem – Israel

  The 56th Annual Meeting of the Israel Society for Microscopy will be held on Tuesday May 23rd, 2023 at the Binyanei Hauma - International Convention Center, Jerusalem. 
  The meeting will be preceded by a one day tutorial workshop on Monday May 22nd, 2023 at the Hebrew University of Jerusalem.

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• 8th Meeting of the International Union of Microbeam Analysis Societies

  11 to 16 June 2023
  Banff – Canada

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• SCANDEM conference June 2023

  12 to 15 June 2023
  Uppsala Ångström Laboratory – Uppsala – Sweden

   

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