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Past Events

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  • Call for abstracts: MFS-2017 Conference

    05 to 08 September 2017
    Zaragoza – Spain

  • Microscopy Conference 2017

    21 to 25 August 2017
    SwissTech Convention Center – Lausanne – Switzerland

    Microscopy conference jointly organised by: SSOM – Swiss Society for Optics and Microscopy ASEM – Austrian Society for Electron Microscopy DGE – German Society for Electron Microscopy e.V.

  • Microscopy & Microanalysis 2017 Meeting

    06 to 10 August 2017
    St. Louis – Missouri – USA

  • Crick Electron Microscopy Opening Symposium

    12 and 13 July 2017
    Francis Crick Institute – London – United Kingdom

    The Francis Crick Institute in London will host a symposium to celebrate the opening of the new Electron Microscopy Science Technology Platforms, with national and international invited speakers presenting the cutting edge in application of imaging technology to answer critical research questions, from molecules to whole organisms. The symposium will include presentations on new frontiers in imaging and big data analysis and will be accompanied by an interactive exhibition. The symposium will be followed by a day of hands-on workshops and demonstrations, using a wide range of the techniques and technologies housed in the new facilities.

  • Crick Electron Microscopy symposium

    12 to 14 July 2017
    The Francis Crick Institute in London – London – United Kingdom

    Closing date for registrations is 21st June 2017.

  • 1st EUFN workshop (Former DACH Workshop) : general FIB and FIB applications

    04 and 05 July 2017
    Graz – Austria

    Abstract application deadline: 30 April 2017

  • Microscience Microscopy Congress 2017

    03 to 06 July 2017
    Manchester – United Kingdom

    The Microscience Microscopy Congress, incorporating EMAG is returning to Manchester in the Summer of 2017.

    mmc2017 will provide something for everyone with an interest in microscopy and imaging.

    With an international 3 day conference consisting of six parallel sessions, a huge exhibition of over 100 companies plus a range of free training opportunities and extra satellite events and drop-in workshops, you can be sure that mmc2017 will enable you to return to the workplace with new skills, knowledge and expertise.

    Growing on the success of previous mmc-series events, mmc2017 will include the annual meetings of the EMAG, Frontiers in Bioimaging, SPM, the Microscopy Society of Ireland and the Scottish Microscopy Group.

    Abstract Submission and Registration is now open.

    Submit your abstract at

  • 3rd International TEM Spectroscopy Workshop in Materials Science

    19 to 22 June 2017
    Uppsala – Sweden

    It is designed for researchers from all branches of the materials sciences who are interested in how the TEM spectroscopy techniques, Energy Dispersive X-Ray (EDX) and Electron Energy-Loss Spectroscopy (EELS) can be employed in their understanding of the nanoscale.

     The workshop starts at 14:00 on 19th June 2017  and consists of two days of lectures and a third day of laboratory sessions. Registration for the entire workshop costs 150 EUR for students and 200 EUR for researchers and includes the workshop dinner. Travel grants for students may be available.

  • Royal Society Publishing photography competition 2017

    07 June 2017
    London – United Kingdom


    For your chance to win, simply submit a photograph that depicts aninteresting scientific phenomenon in one of the following categories:



    Earth science and climatology 

    Ecology and environmental science



    Submit your entry via


  • CCEM Summer School on Electron Microscopy

    05 to 09 June 2017
    McMaster University – Canada

    The Canadian Centre for Electron Microscopy would like to announce its 2017 Summer School on Electron Microscopy.

    Each year the Centre welcomes participants from around the world to the McMaster University campus in Hamilton, Ontario, Canada for an advanced school on electron microscopy.

    The course runs over five days and aims to provide students with advice in solving characterization problems using advanced electron microscopy techniques. With the help of experts, users with experience in electron microscopy learn about the fundamentals of aberration-corrected imaging, electron energy loss spectroscopy, electron tomography, ultimate physical limits (beam damage and resolution) and the use of aberration-corrected electron microscopes.

    There are many opportunities for hands-on training on the alignment and operation of the electron microscopes with experts from the microscope and spectrometer companies. Several hands-on data processing sessions are also organised.

    For more information please go to:

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