Complete calendar

You can find hereunder a list of all events that may be interesting to EMS members.

Suggestions for microscopy related events to be listed in this calendar can be sent to the EMS secretary.

Webinars are listed on a separate page

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Open, reproducible hardware for microscopy. Theo Murphy meeting
22 and 23 May 2023
Glasgow – United Kingdom
Frontiers of in-situ materials characterization - from new instrumentation and methods to imaging aided materials design
29 May to 02 June 2023
Congress & Exhibition center – Strasbourg – France
22nd International European Light Microscopy Initiative Meeting
06 to 09 June 2023
Netherlands
EUFN FIB Workshop
07 to 09 June 2023
Zürich – Switzerland
8th Meeting of the International Union of Microbeam Analysis Societies
11 to 16 June 2023
Banff – Canada
SCANDEM conference June 2023
12 to 15 June 2023
Uppsala Ångström Laboratory – Uppsala – Sweden
27th Wilhelm Bernard Workshop on the Cell Nucleus
19 to 23 June 2023
Prague – Czech Republic
The purpose of the 5-day workshop is to create a multidisciplinary meeting representing various research approaches most used in studies on the cell nucleus structure, functions, and relationships and contribute to our understanding of genome functioning, cancer development, diagnostics and cure.

The main part of the WBW consists of the following sessions:
- Nuclear Compartments and Gene Expression
- Nuclear Lipids and Phase Separation in Health and Disease (organized as a workshop of the COST Action 19105)
- DNA Replication, Repair, Disease
- Novel Methods in Nuclear Research and Diagnostics
- Pathogenesis and Cancer (organized as a Symposium of the Society for Histochemistry)
Oral lectures will be complemented by a Poster session and ceremonies to award the Wilhelm Bernhard Medal and a Young Researcher Award.
7th Microscopy Characterisation of Organic-Inorganic Interfaces Conference
27 and 28 June 2023
Canadian Centre for Electron Microscopy – Hamilton – Canada
The 7th Microscopy Characterisation of Organic-Inorganic Interfaces (MCOII) meeting will return to an in-person format in 2023 and will be hosted for the first time in North America at McMaster University in Hamilton, Canada, home of the Canadian Centre for Electron Microscopy.

The transatlantic scientific organizing team of Nadja V. Tarakina (MPIKG, Germany) and Kathryn Grandfield (McMaster University, Canada) have put together an exciting two-day programme. As usual, the first day will be more general, covering a broad range of microscopy approaches (correlative microscopy solutions, in-situ liquid microscopy methods, low-voltage electron microscopy and many more) in the context of imaging hybrid and soft matter.

On the second day, a special Focus Lecture Series, entitled “Multi-dimensional and multiscale microscopy of organic-inorganic interface” will cover a more-detailed range of lectures on tomographic methods spanning light, X-ray and electron microscopy, as well as atom probe tomography and in situ electron microscopy/tomography.

This conference will bring together world-leading experts in microscopy, highlighting the latest achievements, new opportunities and outstanding challenges in probing beam-sensitive and hybrid materials and their interfaces.
MMC 2023
03 to 06 July 2023
Manchester – United Kingdom

Make sure your 2023 diary includes mmc2023 which is returning to Manchester from 3-6 July. As with the previous events, you can expect a huge and varied scientific conference alongside Europe's largest free microscopy and imaging exhibition filled with a huge number of free training workshops.
CMD 30-Fismat
04 to 08 September 2023
Milano – Italy
Electron microscopies (EM) are demonstrating more and more impressive insight into condensed matter physics. This minicolloquium will share the most advanced applications and perspectives across the electron microscopy community.
Transmission electron microscopy (TEM) boasts sub-atomic lateral resolution combined with spectroscopic selectivity down to meV range and ultrafast time resolution, into the attosecond range, making it one of the most complete microscopic tools for the investigation of carefully prepared thin samples. The introduction of focused ion beams (FIB) dramatically increased the range of application of TEM. Further advances include gaining control on the angular momentum of primary electrons and acquiring in operando capabilities to address real world phenomena. Scanning electron Microscopy (SEM) is still mostly devoted to imaging applications on bulk systems, featuring tunable depth sensitivity and the ability of rapidly switching from large fields of view down to nanoscale lateral resolution. Analytical spectroscopic tools like X-Ray fluorescence and cathodoluminescence provide elemental
concentration, chemical and electronic structure bulk properties, where the lateral resolution and energy selectivity are a few orders of magnitude larger than in TEM. The advent of low voltage SEM, low energy EM (LEEM) and controlled environments pave the way to still more pioneering developments towards highly surface sensitive, energy and time selective analytical capabilities. Local insights into the electronic structure of condensed matter were demonstrated [9]. The surface sensitivity of the SEM probe would make a very fruitful match with the already demonstrated capabilities of TEMs for bulk properties, with the further possibility of implementing in operando non-destructive studies. Ab-initio numerical modeling plays an increasingly crucial role to fully exploit EM.
Abstract for oral and poster contribution can be submitted at https://eventi.cnism.it/cmd30-fismat/submission_form within the DEADLINE of April, 15th, 2023. You will have to select the mini-colloquium in the second submission page.

Conference fees:
- Early bird until July 16th: 350 €
- Late registration from July 17 to September 3rd: 400 €
- On site registration: 450 €
Reduced fee for young scientist born in 1993 and successive years.
- Early bird until July 16th: 200 €
- Late registration from July 17 to September 3rd: 250 €

We hope to welcome you on site next September,

Alberto Tagliaferri (Politecnico di Milano, Milano, Italy),
Jacob Hoogenboom (TUDelft, Delft, The Netherlands),
Filip Mika (ISI CAS, v.v.i., BRNO, Czech Republic),
Silvia Pietralunga (CNR-IFN, Milano, Italy)