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European Microscopy Society (EMS)

November 18-19, 2026
Top Analytica, Ruukinkatu 4, 20540 Turku

Join us for the Advanced Sample Preparation Workshop & BIB User Meeting, a two-day event dedicated to the latest developments and applications of Broad Ion Beam (BIB) milling technology.

Organized in collaboration between Top Analytica and Spectral, this event brings together researchers, engineers, and microscopy professionals to explore the full potential of ion beam milling for advanced sample preparation.

Whether you are new to BIB milling and want to learn the fundamentals, or an experienced user looking to deepen your expertise, the program offers a valuable combination of theoretical presentations, practical case studies, and hands-on demonstrations. Existing BIB users also have the opportunity to attend the dedicated BIB User Meeting, where participants will share experiences, discuss advanced applications, and exchange best practices.

Take advantage of this opportunity to expand your knowledge, discover new techniques, and connect with experts and fellow users in the field of advanced sample preparation.