22 – 24 March 2027 
Cambridge, UK

The conference will focus on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of electron microscopy. The latest developments in the use of other important microcharacterisation techniques including scanning probe microscopy, X-ray topography and diffraction will also be featured. Developments in materials science and technology covering the complete range of elemental and compound semiconductors will be addressed.