 Instrumentation & Methods .................................................................................................................................................................
Materials Science & Physics
Life Sciences
Books are listed in order of publication date
INSTRUMENTATION & METHODS
 Nanoscopy and Multidimensional Optical Fluorescence Microscopy
Edited by: Alberto Diaspro, University of Genoa, Italy
Published by: CRC Press, Taylor & Francis Group
February 12, 2010
ISBN: 978-1420-07886-2
ISBN 10: 1420078860
URL: http://208.254.79.11/product/isbn/9781420078862;jsessionid=x65eCMW5NSIevE2tFTCIYA**
New Horizons of Applied Scanning Electron Microscopy
Authors: Shimizu, Kenichi; Mitani, Tomoaki
Published by: Springer
2010
ISBN: 978-3-642-03159-5
URL: http://www.springer.com/materials/surfaces+interfaces/book/978-3-642-03159-5
Aberration-corrected Imaging in Transmission Electron Microscopy
Edited by: Rolf Erni
Published by: World Scientific Publishing Co.
2010
ISBN: 978-1-84816-536-6
URL: http://www.worldscibooks.com/materialsci/p703.html
An Introduction to Microscopy
Authors: Suzanne Bell and Keith Morris
Published by: CRC Press, London, UK
October 2009
ISBN: 9781420084504
URL: http://www.crcpress.com/product/isbn/9781420084504
New possibilities with aberration-corrected electron microscopy
Editors: David Cockayne, Angus Kirkland, Peter Nellist and Andrew Bleloch
Published by: Royal Society Publishing, London, UK
September 2009
ISBN: 9780854037698
EMS reduction: please contact the EMS secretary for reduction code
URL: http://rsta.royalsocietypublishing.org/site/issues/microscopy.xhtml
In Situ Electron Microscopy at High Resolution
Edited by: Florian Banhart
Published by: World Scientific Publishing Co.
July 2009
ISBN: 978-981-279-733-9
URL: http://www.worldscibooks.com/materialsci/6792.html
LARGE ANGLE CONVERGENT BEAM ELECTRON DIFFRACTION (LACBED)
Edited by: Jean-Paul Morniroli
Published by: Sfµ (Société française des Microscopies)
May 2009
ISBN: -
URL: http://90plan.ovh.net/~sfmuredh/IMG/article_PDF/article_23.pdf
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
Author: Echlin, Patrick
Published by: Springer
2009
ISBN: 978-0-387-85730-5
URL: http://www.springer.com/materials/characterization+&+evaluation/book/978-0-387-85730-5
4D ELECTRON MICROSCOPY
Imaging in Space and Time
Edited by: Ahmed H Zewail (California Institute of Technology, USA) & John M Thomas (University of Cambridge, UK)
Published by: World Scientific Publishing Co.
2009
ISBN: 978-1-84816-400-0
URL: http://www.worldscibooks.com/chemistry/p641.html
IN-SITU ELECTRON MICROSCOPY AT HIGH RESOLUTION
Edited by: Florian Banhart (Université de Strasbourg, France)
Published by: World Scientific Publishing Co.
2009
ISBN: 978-981-279-733-9
URL: http://www.worldscibooks.com/materialsci/6792.html
Applied Scanning Probe Methods XI
Scanning Probe Microscopy Techniques
Authors: Bhushan, Bharat; Fuchs, Harald (Eds.)
Published by: Springer
Publication date: 2009
ISBN: 978-3-540-85036-6
URL: http://www.springer.com/materials/nanotechnology/book/978-3-540-85036-6
Applied Scanning Probe Methods XII
Characterization
Authors: Bhushan, Bharat; Fuchs, Harald (Eds.)
Published by: Springer
Publication date: 2009
ISBN: 978-3-540-85038-0
URL: http://www.springer.com/materials/nanotechnology/book/978-3-540-85038-0
Applied Scanning Probe Methods XIII
Biomimetics and Industrial Applications
Authors: Bhushan, Bharat; Fuchs, Harald (Eds.)
Published by: Springer
Publication date: 2009
ISBN: 978-3-540-85048-9
URL: http://www.springer.com/materials/nanotechnology/book/978-3-540-85048-9
Advances in Imaging and Electron Physics Volume 159
The scanning transmission electron microscope
Edited by: Peter W. Hawkes
Published by: Elsevier Inc.
Publication date: 2009
ISBN: 978-0-12-374986-4
URL: http://www.elsevierdirect.com/product.jsp?isbn=9780123749864
Advances in Imaging and Electron Physics Volume 153
Aberration-corrected microscopy
Edited by: Peter W. Hawkes
Published by: Elsevier Inc.
Publication date: 2008
ISBN: 978-0-12-374220-9
URL: http://www.elsevierdirect.com/product.jsp?isbn=9780123742209
Applied Scanning Probe Methods IX
Characterization
Authors: Bhushan, Bharat; Fuchs, Harald; Tomitori, Masahiko (Eds.)
Published by: Springer
Publication date: 2008
ISBN: 978-3-540-74082-7
URL: http://www.springer.com/materials/nanotechnology/book/978-3-540-74082-7
Applied Scanning Probe Methods VIII
Scanning Probe Microscopy Techniques
Authors: Bhushan, Bharat; Fuchs, Harald; Tomitori, Masahiko (Eds.)
Published by: Springer
Publication date: 2008
ISBN: 978-3-540-74079-7
URL: http://www.springer.com/materials/nanotechnology/book/978-3-540-74079-7
Applied Scanning Probe Methods X
Biomimetics and Industrial Applications
Authors: Bhushan, Bharat; Fuchs, Harald; Tomitori, Masahiko (Eds.)
Published by: Springer
Publication date: 2008
ISBN: 978-3-540-74084-1
URL: http://www.springer.com/materials/nanotechnology/book/978-3-540-74084-1
Applied Charged Particle Optics
Author: Liebl, Helmut
Published by: Springer
Publication date: 2008
ISBN: 978-3-540-71924-3
URL: http://www.springer.com/physics/optics/book/978-3-540-71924-3
Transmission Electron Microscopy
Physics of Image Formation
Authors: Reimer, L., Kohl, H.
Published by: Springer
Publication date: 2008
ISBN: 978-0-387-40093-8
URL: http://www.springer.com/materials/book/978-0-387-40093-8
Principles and Practice of Variable Pressure: Environmental Scanning Electron Microscopy (VP-ESEM)
Author: Debbie Stokes
Published by: John Wiley & Sons, Inc
Publication date: 2008
ISBN: 978-0-470-06540-2
URL: http://eu.wiley.com/WileyCDA/WileyTitle/productCd-0470065400.html
Advances in Imaging & Electron Physics, vol. 153
Aberration-corrected Electron Microscopy
Author: P.W. Hawkes (Ed.)
Published by: Elsevier
Publication date: 2008
ISBN: 978-0-12-374220-9
URL: http://www.elsevier.com/wps/find/bookdescription.cws_home/716296/description#description
Guide de Préparation des Echantillons pour la Microscopie Electronique en Transmission, 2 vols
Edited by: J. Ayache, L. Beaunier, J. Boumendil, G. Ehret and D. Laub
Published by: l’Université de Saint-Etienne
2007
ISBN: 978-2-86272-441-6 and 978-2-86272-442-3
URL: Vol I and Vol II
Electron Microscopy
Methods and Protocols, 2nd ed.
Edited by: Kuo, John
Published by: Springer
2007
ISBN: 978-1-58829-573-6
URL: http://www.springer.com/life+sci/cell+biology/book/978-1-58829-573-6
Scanning Microscopy for Nanotechnology
Techniques and Applications
Edited by: Zhou, Weilie; Wang, Zhong Lin (Eds.)
Published by: Springer
2007
ISBN: 978-0-387-33325-0
URL: http://www.springer.com/materials/nanotechnology/book/978-0-387-33325-0
An Introduction to the Passage of Energetic Particles through Matter
Author: N.J Carron
Published by: CRC Press, Taylor & Francis Group
November, 2006
ISBN: 9780750309356
ISBN 10: 0750309350
URL: http://www.crcpress.com/product/isbn/9780750309356
Science of Microscopy (2nd printing)
Authors: Hawkes, Peter W.; Spence, John C.H. (Eds.)
Published by: Springer
Publication date: 2006, 2nd printing, 2007
ISBN: 978-0-387-25296-4
URL: http://www.springer.com/materials/characterization+%26+evaluation/book/978-0-387-25296-4
Dictionary of Microscopy
Author: Julian P. Heath
Published by: John Wiley & Sons, Ltd
August 2005
ISBN: 978-0-470-01199-7
URL: http://eu.wiley.com/WileyCDA/WileyTitle/productCd-0470011998,subjectCd-LSB0.html
MATERIALS SCIENCE & PHYSICS
Geomaterials Under the Microscope - A colour guide
Building stone, roofing slate, aggregate, concrete, mortar, plaster, bricks, ceramics and bituminous mixtures
Author: Jeremy Ingham
Published by: Manson Publishing Ltd, London, UK
2009
ISBN: 978-1-84076-132-0
EMS reduction: 15%, please contact the EMS secretary for reduction code (deadline: 31/01/2010)
URL: http://www.mansonpublishing.com/sci_titles/Ingham.html
3D Images of Materials Structures: Processing and Analysis
Authors: Joachim Ohser and Katja Schladitz
Published by: Wiley-VCH Verlag GmbH
2009
ISBN: 978-1-84076-132-0
URL: http://eu.wiley.com/WileyCDA/WileyTitle/productCd-352731203X.html
Transmission Electron Microscopy
A Textbook for Materials Science
Authors: Williams, David B., Carter, C. Barry
Published by: Springer
2009
ISBN: 978-0-387-76500-6 (cloth), 978-0-387-76502-0 (paper)
URL: (cloth, single vol.) , (cloth, single vol.)
Transmission Electron Microscopy and Diffractometry of Materials, 3rd ed.
Authors: Fultz, Brent and Howe, James
Published by: Springer
2008
ISBN: 978-3-540-73885-5
URL: http://www.springer.com/materials/characterization+&+evaluation/book/978-3-540-73885-5
Handbook of Microscopy: Applications in Materials Science, Solid-State Physics and Chemistry
Editors: S. Amelinckx, Dirk Van Dyck, J. van Landuyt, G. Van Tendeloo
Published by: Wiley-VCH Verlag GmbH
1997
ISBN: 3-527-29293-4
URL: http://www.amazon.com/Applications-Handbook-Microscopy-Materials-Solid-State
LIFE SCIENCES
ATOMIC FORCE MICROSCOPY FOR BIOLOGISTS
Second Edition
Edited by: Victor J Morris, Andrew R Kirby & A Patrick Gunning
Published by: World Scientific Publishing Co.
Publication date: August 2009
ISBN: 978-1-84816-467-3
URL: http://www.worldscibooks.com/physics/p674.html
Biological Low-Voltage Scanning Electron Microscopy
Authors: Schatten, Heide; Pawley, James B. (Eds.)
Published by: Springer
Publication date: 2008
ISBN: 978-0-387-72970-1
URL: http://www.springer.com/life+sci/book/978-0-387-72970-1
Electron Crystallography of Biological Macromolecules
Edited by: R.M. Glaeser, K. Downing, D. DeRosier, W. Chiu and J. Frank
Published by: Oxford University Press
Publication date: May 2007
ISBN: 978-0-19-508871-7
URL: Electron Crystallography of Biological Macromolecules
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